Project information
Physical properties of new materials and layered structures

Project Identification

MSM 143100002

Project Period

1/1999 - 12/2004

Investor / Pogramme / Project type

Ministry of Education, Youth and Sports of the CR

Research Intents

MU Faculty or unit

Faculty of Science

prof. RNDr. Josef Humlíček, CSc.

Keywords

semiconductors;low-dimensional structures;quantum dots;organic layers;ferroelectrics;high-temperature superconductors;ellipsometry;reflectometry;x-ray diffraction;x-ray reflection

Results

Publications

Total number of publications: 215

1993

X-ray double and triple crystal diffractometry of mosaic structure in heteroepitaxial layers

HOLÝ Václav KUBĚNA Josef

Article in Periodical

J. Appl. Phys., year: 1993, volume: 74, edition: 3
X-ray double and triple crystal diffractometry of silicon crystals with small defects

HOLÝ Václav KUBĚNA Josef

Article in Periodical

Phys. Stat. Sol. (b), year: 1993, volume: 1992, edition: -
X-ray reflection from rough layered systems

HOLÝ Václav KUBĚNA Josef OHLÍDAL Ivan

Article in Periodical

Phys. Rev. B, year: 1993, volume: 47, edition: 23

1992

Infrared refractive index of germanium-silicon alloy crystals

HUMLÍČEK Josef ROESELER Arnulf ZETTLER Thomas KEKOUA Maria KHOUTSISHVILI Elza

Article in Periodical

Applied Optics, year: 1992, volume: 31, edition: 1

1991

REFLECTANCE AND PHOTOREFLECTANCE SPECTRA OF GAAS/ALAS SUPERLATTICES

HUMLÍČEK Josef PLOOG Klaus LUKEŠ František

Article in Periodical

Superlattices and Microstructures, year: 1991, volume: 9, edition: 1