Project information
Laboratory of thin films and nanostructures
- Project Identification
- VS96102
- Project Period
- 7/1996 - 12/2000
- Investor / Pogramme / Project type
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Ministry of Education, Youth and Sports of the CR
- Support to University Research Programmes
- MU Faculty or unit
- Faculty of Science
- Keywords
- Thin films, multilayers, nanostructures, quantum wells, quantum wires
Founding of a research laboratory for studies of thin-film systems and nanostructures attached to the Department of Solid State Physics at Faculty of Science, MU Brno. Selection of up-to-date topics backed by the experience of the Department, focusing onthe experimental methods competitive on the international scale, exploiting of the existing collaboration with domestic and foreign institutions. Some of the proposed research is founded by running grants. The immediate start of the activities of theLaboratory assumes several specific tasks of optical and X-ray studies of the SiGeC layers, quantum wells and superlattices of the GaAlInAsP systém, metallic multilayers, superconducting and polymer films. The scientific team of the Laboratory willcosnsist of four newly appinted, young physicsists, and four members of the Department.
Publications
Total number of publications: 24
2002
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Strain in buried quantum wires: Analytical calculations and x-ray diffraction study
Phys. Rev. B, year: 2002, volume: 2002, edition: 66
2001
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Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings
J. Phys. D: Appl. Phys., year: 2001, volume: 34, edition: 10A
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GID study of strains in Si due to patterned SiO2
J. Phys. D: Appl. Phys., year: 2001, volume: 34, edition: 10A
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Structural investigations on self-organized Si/SiGe islands by grazing incidence small angle x-ray scattering
physica status solidi (b), year: 2001, volume: 224, edition: 1
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TEM investigation of self-organized PbSe quantum dots as a function of spacer layer thickness and growth temperature
Materials Science and Engineering, year: 2001, volume: 80, edition: 1-3
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Thermal stability of partially crystalline Nb/Si multilayers
J. Phys. D: Appl. Phys., year: 2001, volume: 34, edition: 10A
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X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires
J. Phys. D: Appl. Phys., year: 2001, volume: 34, edition: 10A
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X-ray diffraction from CuPt-ordered III-V ternary semiconductor alloy films
Phys. Rev. B, year: 2001, volume: 63, edition: 15
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X-ray reflectivity from self-assembled structures in Ge/Si superlattices
J. Phys.D.: Appl. Phys., year: 2001, volume: 34, edition: 10A
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X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy
Journal of Applied Physics, year: 2001, volume: 89, edition: 9