prof. RNDr. Ivan Ohlídal, DrSc.

2003

• Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe

  OHLÍDAL Ivan KLAPETEK Petr FRANTA Daniel

  Peer-reviewed scientific article

  Československý časopis pro fyziku, year: 2003, volume: 53, edition: 2

• Atomic force microscopy characterization of ZnTe epitaxial films

  KLAPETEK Petr OHLÍDAL Ivan FRANTA Daniel MONTAIGNE-RAMIL Alberto BONANNI Alberta STIFTER David SITTER Helmut

  Peer-reviewed scientific article

  Acta Physica Slovaca, year: 2003, volume: 53, edition: 3

• Atomic force microscopy characterization of ZnTe epitaxial thin films

  KLAPETEK Petr OHLÍDAL Ivan MONTAIGNE-RAMIL Alberto BONANNI Alberta STIFTER David SITTER Helmut

  Peer-reviewed scientific article

  Japanese Journal of Applied Physics, year: 2003, volume: 42, edition: 7B

• Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model

  FRANTA Daniel OHLÍDAL Ivan FRUMAR Miloslav JEDELSKÝ Jaroslav

  Peer-reviewed scientific article

  Applied Surface Science, year: 2003, volume: 212-213, edition: 1

• Characterization of thin films non-uniform in optical parameters by spectroscopic digital reflectometry

  OHLÍDAL Ivan OHLÍDAL Miloslav KLAPETEK Petr ČUDEK Vladimír JÁKL Miloš

  Peer-reviewed scientific article

  Proceedings of SPIE, year: 2003, volume: 5182, edition: 2

• Mikroskopie magnetické síly: Aplikace při studiu pevných disků

  ŠILER Martin OHLÍDAL Ivan KLAPETEK Petr

  Peer-reviewed scientific article

  Československý časopis pro fyziku, year: 2003, volume: 53, edition: 2

• New Dispersion Model of the Optical Constants of the DLC Films

  FRANTA Daniel ZAJÍČKOVÁ Lenka BURŠÍKOVÁ Vilma OHLÍDAL Ivan

  Peer-reviewed scientific article

  Acta Physica Slovaca, year: 2003, volume: 53, edition: 5

• New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters

  OHLÍDAL Miloslav OHLÍDAL Ivan KLAPETEK Petr JÁKL Miloš ČUDEK Vladimír ELIÁŠ Marek

  Peer-reviewed scientific article

  Japanese Journal of Applied Physics, year: 2003, volume: 42, edition: 7B

• Optical constants of ZnTe and ZnSe epitaxial thin films

  FRANTA Daniel OHLÍDAL Ivan KLAPETEK Petr MONTAIGNE-RAMIL Alberto BONANNI Alberta STIFTER David SITTER Helmut

  Peer-reviewed scientific article

  Acta Physica Slovaca, year: 2003, volume: 53, edition: 2

• Optical characterization of ZnSe thin films

  FRANTA Daniel OHLÍDAL Ivan KLAPETEK Petr MONTAIGNE-RAMIL Alberto BONANNI Alberta STIFTER David SITTER Helmut

  Paper in proceedings

  19th Congress of the International Commission for Optics: Optics for the Quality of Life, year: 2003